Scanning electron microscope

Results: 580



#Item
281Plasma-FIB (Focused Ion Beam) The C2MI plasma-FIB is mainly used to perform micro crosssections on samples by using an ion source. The ion source is focused on the sample to obtain a small beam that can etch the surface

Plasma-FIB (Focused Ion Beam) The C2MI plasma-FIB is mainly used to perform micro crosssections on samples by using an ion source. The ion source is focused on the sample to obtain a small beam that can etch the surface

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Source URL: www.c2mi.ca

Language: English - Date: 2014-11-24 15:51:29
282IEEE/ASME TRANSACTIONS ON MECHATRONICS, VOL. 5, NO. 2, JUNE[removed]Controlled Pushing of Nanoparticles: Modeling and Experiments

IEEE/ASME TRANSACTIONS ON MECHATRONICS, VOL. 5, NO. 2, JUNE[removed]Controlled Pushing of Nanoparticles: Modeling and Experiments

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Source URL: nanolab.me.cmu.edu

Language: English - Date: 2012-11-16 19:15:36
283Two-Dimensional Vision-Based Autonomous Microparticle Manipulation using a Nanoprobe Chytra Pawashe and Metin Sitti Nanorobotics Laboratory Scaife Hall 305 Department of Mechanical Engineering

Two-Dimensional Vision-Based Autonomous Microparticle Manipulation using a Nanoprobe Chytra Pawashe and Metin Sitti Nanorobotics Laboratory Scaife Hall 305 Department of Mechanical Engineering

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Source URL: nanolab.me.cmu.edu

Language: English - Date: 2012-11-16 19:15:37
284Ion Milling: Improving sample preparation  The C2MI ion milling tool is mainly used as the final preparation step for metallographic cut (cross-section[removed]mm wide argon ion beam is used mechanically to etch the sample

Ion Milling: Improving sample preparation The C2MI ion milling tool is mainly used as the final preparation step for metallographic cut (cross-section[removed]mm wide argon ion beam is used mechanically to etch the sample

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Source URL: www.c2mi.ca

Language: English - Date: 2014-11-24 15:47:45
285Assessing Mechanisms of Granite Decomposition, ASAS 2006 poster

Assessing Mechanisms of Granite Decomposition, ASAS 2006 poster

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Source URL: www.statemuseum.arizona.edu

Language: English - Date: 2014-05-05 16:13:17
286Electron Microscopy Laboratory Studies of Nuclear Materials The Electron Microscopy Laboratory is equipped with Scanning Electron Microscopes (SEM) and a Transmission Electron Microscope (TEM) adapted for the examination

Electron Microscopy Laboratory Studies of Nuclear Materials The Electron Microscopy Laboratory is equipped with Scanning Electron Microscopes (SEM) and a Transmission Electron Microscope (TEM) adapted for the examination

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Source URL: ec.europa.eu

Language: English - Date: 2013-04-16 09:09:00
287PhD Candidate Position at the Laboratory for Electron Microscopy, Karlsruhe Institute of Technology (Karlsruhe, Germany) Nanotechnology requires imaging techniques with nanometer spatial resolution which yield quantitati

PhD Candidate Position at the Laboratory for Electron Microscopy, Karlsruhe Institute of Technology (Karlsruhe, Germany) Nanotechnology requires imaging techniques with nanometer spatial resolution which yield quantitati

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Source URL: www.lem.kit.edu

Language: English - Date: 2014-07-03 04:32:24
288Nuclear Safeguards and non-Proliferation Environmental Sampling Analysis A key topic in international Safeguards is the work in preventing further spread of nuclear weapon technology and nuclear materials that can be use

Nuclear Safeguards and non-Proliferation Environmental Sampling Analysis A key topic in international Safeguards is the work in preventing further spread of nuclear weapon technology and nuclear materials that can be use

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Source URL: ec.europa.eu

Language: English - Date: 2013-04-16 09:09:43
289Scanning electron microscope (SEM) Application:  Appraisal of polymers, stone, glass et cetera

Scanning electron microscope (SEM) Application:  Appraisal of polymers, stone, glass et cetera

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Source URL: www.isc.fraunhofer.de

Language: English - Date: 2014-03-14 10:01:39
290FRAUNHOFER CAM IS A COMPETENCE CENTER FOR MICROSTRUCTURE DIAGNOSTICS A N D M AT E R I A L C H A R A C T E R I Z AT I O N WITHIN FRAUNHOFER IWM IN HALLE FRAUNHOFER CENTER

FRAUNHOFER CAM IS A COMPETENCE CENTER FOR MICROSTRUCTURE DIAGNOSTICS A N D M AT E R I A L C H A R A C T E R I Z AT I O N WITHIN FRAUNHOFER IWM IN HALLE FRAUNHOFER CENTER

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Source URL: www.iwm.fraunhofer.de

Language: English - Date: 2014-05-20 04:27:23